Items where Author is "Yoneda, Tomokazu"

Article

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Fujiwara, Hideo (2008) NoC-Compatible Wrapper Design and Optimization under Channel-Bandwidth and Test-Time Constraints. Transactions on Information and Systems, Volume (Issue ). pp. 2008-2017. ISSN 0916-8532

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Fujiwara, Hideo (2008) On NoC Bandwidth Sharing for the Optimization of Area Cost and Test Application Time. Transactions on Information and Systems, Volume (Issue ). pp. 1997-2007. ISSN 0916-8532

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Orailoglu, Alex and Fujiwara, Hideo (2008) Scheduling Power-Constrained Tests through the SoC Functional Bus. Transactions on Information and Systems, Volume (Issue ). pp. 736-746. ISSN 0916-8532

Conference or Workshop Item

Hussin, Fawnizu Azmadi and Yu, Thomas Edison Chua and Yoneda, Tomokazu and Fujiwara, Hideo (2010) RedSOCs‐3D: Thermal‐safe Test Scheduling for 3D‐Stacked SoC. In: 2010 IEEE Asia Pacific Conference on Circuits and Systems, 6-9 December, 2010, Kuala Lumpur, Malaysia.

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Fujiwara, Hideo (2008) Core-Based Testing of System-on-Chips Utilizing the Network-on-Chip Resources. In: PhD Student Forum, Asia and South Pacific Design Automation Conference (ASP-DAC'08), January 2008, Japan.

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Fujiwara, Hideo (2007) Area Overhead and Test Time Co-Optimization through NoC Bandwidth Sharing. In: IEEE 16th Asian Test Symposium 2007 (ATS'07), 8-11 October 2007, Beijing, China.

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Fujiwara, Hideo (2007) Optimization of NoC Wrapper Design Under Bandwidth and Test Time Constraints. In: 12th IEEE European Test Symposium (ETS'07), 20-24 May 2007, Freiburg, Germany.

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Orailoglu, Alex and Fujiwara, Hideo (2007) Core-Based Testing of Multiprocessor System-on-Chips Utilizing Hierarchical Functional Buses. In: 12th Asia and South Pacific Design Automation Conference (ASP-DAC'07), Jan. 23-26 2007 , Yokohama, Japan.

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Fujiwara, Hideo (2007) NoC Wrapper Optimization under Channel Bandwidth and Test Time Constraints. In: Technical Report of IEICE (DC2006-80), Vol. 106, No. 528, February 2007, Japan.

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Orailoglu, Alex and Fujiwara, Hideo (2006) Power-Constrained SOC Test Schedules through Utilization of Functional Buses. In: IEEE International Conference on Computer Design (ICCD'06), 1-4 October 2006, San Jose, USA.

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Orailoglu, Alex and Fujiwara, Hideo (2006) Power-Conscious Microprocessor-Based Testing of System-on-Chip. In: Technical Report of IEICE (VLD2006-6), Vol. 106, No. 32, May 2006, Japan.