Items where Author is "Latif, Mohd Azman Abdul "

Conference or Workshop Item

Latif, Mohd Azman Abdul and Zain Ali, Noohul Basheer and Hussin, Fawnizu Azmadi (2012) Design for Cold Test Elimination - Facing the Inverse Temperature Dependance (ITD) Challenge. In: 2012 IEEE International Symposium on Circuits and Systems (ISCAS 2012), 20-23 May 2012, Seoul, Korea.

Latif, Mohd Azman Abdul and Zain Ali, Noohul Basheer and Hussin, Fawnizu Azmadi (2011) A Case Study of Process Variation Effect to SoC Analog Circuits. In: IEEE Recent Advances in Intelligent Computational Systems, Sep 22-24,2011, Trivandrum, India.