Items where Author is "Hai, H. Lo"

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Article

B. I. Reaz, Mamun and F. Lee, Weng and Hamid, Nor Hisham and Hai, H. Lo and Y. M. Shakaff, Ali (2009) High Degree of Testability Using Full Scan Chain and ATPG: An Industrial Perspective. Journal of Applied Sciences. ISSN 18125654

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