Number of items: 3.
Book
Anwer, Janhanzeb and Hamid, Nor Hisham and Asirvadam , Vijanth Sagayan
(2011)
An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs
Zoom
See larger image (with zoom)
Share your own customer images
Publisher: learn how customers can search inside this book.
An Improved Markov Random Field Design Approach For Digital Circuits: Introducing Fault-Tolerance With Higher Noise-Immunity For The Nano-Circuits As Compared To CMOS And MRF Designs.
LAP LAMBERT Academic Publishing, Germany.
ISBN 978-3844332636
Conference or Workshop Item
Anwer, Janhanzeb and Khalid, Usman and Hamid, Nor Hisham and Asirvadam , Vijanth Sagayan
(2010)
Highly noise-tolerant design of digital logic gates using Markov Random Field modelling.
In: International Conference on Electronic Computer Technology (ICECT), 2010, Kuala Lumpur.
Anwer, Janhanzeb and Khalid, Usman and Hamid, Nor Hisham and Asirvadam , Vijanth Sagayan and Singh, Narenderjit
(2010)
Highly noise-tolerant design of digital logic gates using Markov Random Field modelling.
In: International Conference on Electronic Computer Technology (ICECT), 2010, 7-10 May 2010, Kuala Lumpur.
This list was generated on Mon Apr 23 16:26:55 2018 MYT.
