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Items where Author is "A.Y.M., Shakaff "

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Citation Index Journal

M.B.I., Reaz and W.F., Lee and N.H., Hamid and H.H., Lo and A.Y.M., Shakaff (2009) High degree of testability using full scan chain and ATPG-An industrial perspective. [Citation Index Journal]

This list was generated on Fri Aug 18 23:51:37 2017 MYT.