| Login | Reset Password |
Items where Author is "A.Y.M., Shakaff "
Group by: Item Type | No Grouping Jump to: Article Number of items: 1.
ArticleM.B.I., Reaz and W.F., Lee and N.H., Hamid and H.H., Lo and A.Y.M., Shakaff (2009) High degree of testability using full scan chain and ATPG-An industrial perspective. Journal of Applied Sciences, 9 (14). pp. 2613-2618. ISSN 18125654 |
