Modified short-run statistical process control for test and measurement process

Koh, C.K. and Chin, J.F. and Kamaruddin, S. (2019) Modified short-run statistical process control for test and measurement process. International Journal of Advanced Manufacturing Technology, 100 (5-8). pp. 1531-1548.

Full text not available from this repository.

Item Type:	Article
Impact Factor:	cited By 4
Depositing User:	Ms Sharifah Fahimah Saiyed Yeop
Date Deposited:	27 Aug 2021 08:27
Last Modified:	27 Aug 2021 08:27
URI:	http://scholars.utp.edu.my/id/eprint/25118

Actions (login required)

View Item