A Review on Key Issues and Challenges in Devices Level MEMS Testing

Shoaib, M. and Hamid, N.H. and Malik, A.F. and Zain Ali, N.B. and Tariq Jan, M. (2016) A Review on Key Issues and Challenges in Devices Level MEMS Testing. Journal of Sensors, 2016.

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Item Type:	Article
Impact Factor:	cited By 23
Depositing User:	Ms Sharifah Fahimah Saiyed Yeop
Date Deposited:	23 Aug 2021 13:25
Last Modified:	23 Aug 2021 13:25
URI:	http://scholars.utp.edu.my/id/eprint/24250

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