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Detectability Analysis for Resistive Open Faults with Dynamic Supply Voltage Scaling Awareness

Mohammadat, Mohamed Tag Elsir and Zain Ali, Noohul Basheer and Hussin, Fawnizu Azmadi (2011) Detectability Analysis for Resistive Open Faults with Dynamic Supply Voltage Scaling Awareness. In: 3rd Asia Symposium on Quality Electronic Design (ASQED 2011), 19 - 20 July 2011, Kuala Lumpur, Malaysia.

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Abstract

Dynamic supply voltage scaling (DVS) is an efficient and practical design technique to reduce power consumption in VLSI devices. Due to the multiple voltage operating environment and the supply voltage dependent behavior of physical faults, obtaining a minimal test set which gives the best fault coverage is challenging. Researchers have showed that testing of resistive opens is best achieved at high supply voltage. However based on our experimental results on ISCAS-85 circuits it is shown that is not always the case for DVS enabled designs. This paper analyzes and identifies different detectability patterns for resistive open faults in such designs. Additionally it discussed the multi-VDD testing and its necessity to achieve 100% fault coverage.

Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:Departments > Electrical & Electronic Engineering
ID Code:6346
Deposited By: Dr Fawnizu Azmadi Hussin
Deposited On:05 Sep 2011 00:38
Last Modified:19 Jan 2017 08:22

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