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Review of High Level Fault Modeling Approaches for Mixed-Signal Systems

Xia, Likun and Bell, Ian and Wilkinson, Antony (2011) Review of High Level Fault Modeling Approaches for Mixed-Signal Systems. JOURNAL OF ELECTRONICS (CHINA), 27 (4). pp. 490-497. ISSN 02179822

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Abstract

In the modern analogue design, Transistor Level Fault Simulation (TLFS) plays the important part since every fault in the whole circuit has to be simulated at that level. Unfortunately, it is a very CPU intensive task even though it maintains the high accuracy. Therefore, High Level Fault Modeling (HLFM) and High Level Fault Simulation (HLFS) are required in order to alleviate the efforts of simulation. In this paper, different HLFM approaches are reviewed at the device level during last two decades. We clarify their domains of application and evaluate their strengths and current limitations. We also analyze causes of faults and introduce various test approaches.

Item Type:Article
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:Centre of Excellence > Center for Intelligent Signal and Imaging Research
Departments > Electrical & Electronic Engineering
ID Code:6145
Deposited By: Dr. L Xia
Deposited On:07 Jul 2011 06:55
Last Modified:19 Jan 2017 08:22

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