Dynamic Voltage Scaling Aware Delay Fault Testing

Zain Ali, Noohul Basheer and Zwolinski, Mark and Al-Hashimi, Bashir M and Harrod, Peter (2006) Dynamic Voltage Scaling Aware Delay Fault Testing. In: Eleventh IEEE European Test Symposium, 21-24 May, 2006, Southampton, UK.

[img] PDF - Published Version
Restricted to Registered users only


Official URL: http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arn...


The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults. This paper analyses the influence of different voltage/frequency settings on fault detection within a DVS application. In particular, the effect of supply voltage on different types of delay faults is considered. This paper presents a study of these problems with simulation results. We have demonstrated that the test application time increases as we reduce the test voltage. We have also shown that for newer technologies we do not have to go to very low voltage levels for delay fault testing. We conclude that it is necessary to test at more than one operating voltage and that the lowest operating voltage does not necessarily give the best fault cover.

Item Type:Conference or Workshop Item (Lecture)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:Departments > Electrical & Electronic Engineering
ID Code:4817
Deposited By: Dr Noohul Basheer Zain Ali
Deposited On:23 Mar 2011 03:44
Last Modified:19 Jan 2017 08:27

Repository Staff Only: item control page

Document Downloads

More statistics for this item...