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Testing of Level Shifters in Multiple Voltage Designs

Zain Ali, Noohul Basheer and Zwolinski, Mark and Al-Hashimi, Bashir M (2007) Testing of Level Shifters in Multiple Voltage Designs. In: Electronics, Circuits and Systems, 2007. ICECS 2007. 14th IEEE International Conference on , 11-14 Dec 2007, Marrakech, Morocco.

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Abstract

The use of multiple voltages for different cores is becoming a widely accepted technique for efficient power management. Level shifters are used as interfaces between voltage domains. Through extensive transistor level simulations of resistive open, bridging and resistive short faults, we have classified the testing of level shifters into PASSIVE and ACTIVE modes. We examine if high test coverage can be achieved in the PASSIVE mode. We consider resistive opens and shorts and show that, for testing purposes, consideration of purely digital fault effects is sufficient. Thus conventional digital DfT can be employed to test level shifters. In all cases, we conclude that using sets of single supply voltages for testing is sufficient.

Item Type:Conference or Workshop Item (Lecture)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:Departments > Electrical & Electronic Engineering
ID Code:4813
Deposited By: Dr Noohul Basheer Zain Ali
Deposited On:23 Mar 2011 05:42
Last Modified:19 Jan 2017 08:26

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