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Autoregressive Wiener filtering in a scanning electron microscopy imaging system

Kamel , Nidal (2005) Autoregressive Wiener filtering in a scanning electron microscopy imaging system. [Citation Index Journal]

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Official URL: http://onlinelibrary.wiley.com/journal/10.1002/(IS...

Abstract

In this paper, we propose to use the autoregressive (AR)-based interpolator with Wiener filter and apply the idea to scanning electron microscope (SEM) images. The concept for combining the AR-based interpolator with Wiener filtering comes from the essential requirement of Wiener filtering for accurate and consistent estimation of the power of the noise in images prior to filter implementation. The resultant filter is called AR-Wiener filter. The proposed filter is embedded onto the frame grabber card of the scanning electron microscope (SEM) for real-time image processing. Different images are captured using SEM and used to compare the performances of the conventional Wiener and the proposed AR-Wiener technique.

Item Type:Citation Index Journal
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:Mission Oriented Research > Health
ID Code:4709
Deposited By: Assoc Prof Dr Nidal Kamel
Deposited On:23 Mar 2011 01:30
Last Modified:19 Jan 2017 08:27

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