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Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images

Malik , Aamir Saeed and Tae, Sun Choi (2009) Analysis of Effects of Texture Reflectance and Source Illumination on Focus Measures for Microscopic Images. In: 2009 International Conference on Computer and Electrical Engineering, 28-30 December, 2009, Dubai, UAE.

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Abstract

Focus measures are an integral part for the passive 3D shape recovery methods. This paper presents an analysis of various well established focus measures with varying texture reflectance and source illumination. Five focus measures are selected from the literature. Three different microscopic objects are selected for testing the texture reflectance. Three different levels are opted for source illumination. Among the passive methods, Shape From Focus (SFF) is selected to test the focus measures for accuracy and precision of depth estimation.

Item Type:Conference or Workshop Item (Paper)
Impact Factor:IEEE Indexed, Scopus Indexed
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:Research Institutes > Institute for Health Analytics
Centre of Excellence > Center for Intelligent Signal and Imaging Research
Departments > Electrical & Electronic Engineering
ID Code:4519
Deposited By: Dr Aamir Saeed Malik
Deposited On:14 Mar 2011 03:05
Last Modified:19 Jan 2017 08:25

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