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Area Overhead and Test Time Co-Optimization through NoC Bandwidth Sharing

Hussin, Fawnizu Azmadi and Yoneda, Tomokazu and Fujiwara, Hideo (2007) Area Overhead and Test Time Co-Optimization through NoC Bandwidth Sharing. In: IEEE 16th Asian Test Symposium 2007 (ATS'07), 8-11 October 2007, Beijing, China.

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Abstract

In this paper, a new approach to NoC test scheduling based on bandwidth-sharing is presented. The test scheduling is performed under the objective of co-optimizing the wrapper area overhead and the resulting test application time using two complementary NoC wrappers. Experimental results showed that the area overhead can be optimized (to an extent) without compromising the test application time. Compared to other NoC scheduling approaches based on dedicated paths, our bandwidth sharing approach can reduce the test application time by up to 75.4%.

Item Type:Conference or Workshop Item (Paper)
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE:Departments > Electrical & Electronic Engineering
ID Code:3591
Deposited By: Dr Fawnizu Azmadi Hussin
Deposited On:23 Dec 2010 08:43
Last Modified:19 Jan 2017 08:26

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