Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band

Jilani, M.T. and Cheong, L.Y. and Saand, A.S. and Wen, W.P. and Rehman, M.Z.U. (2016) Non-destructive characterization of dielectric materials by microwave spectroscopy in LS band. Journal of Optoelectronics and Advanced Materials, 18 (5-6). pp. 589-594.

Full text not available from this repository.

Official URL: https://www.scopus.com/inward/record.uri?eid=2-s2....


The paper describes the characterization of dielectric materials, by using a resonance based ring-resonator method. A microstrip ring resonator (MRR) method is presented to measure effective dielectric constant (ϵreff) of composite laminate materials. Multilayer structure of MRR is designed and simulated using Ansoft's High Frequency Structure Simulation. Comparative study of polytetrafluoroethylene (PTFE), ceramic and ceramic-PTFE composites have been carried out to analyze the åreff along with its dependence on sheet thickness. From results, it is clearly observed that as the thickness of overlay is increased there is significant change in effective permittivity, which is more noticeable for high-permittivity ceramic material than low-permittivity PTFE material. Measured data is found in good agreement with the reported data.

Item Type:Article
Impact Factor:cited By 0
Uncontrolled Keywords:Laminated composites; Laminates; Microwave spectroscopy; Nondestructive examination; Optical resonators; Permittivity; Polytetrafluoroethylenes; Rings (components), Ceramics; Effective dielectric constants; Effective permittivity; High frequency structure simulation; Microstrip ring resonator; Multilayer structures; Nondestructive characterization; Polytetrafluoroethylene (PTFE), Dielectric materials
ID Code:25603
Deposited By: Ms Sharifah Fahimah Saiyed Yeop
Deposited On:27 Aug 2021 09:59
Last Modified:27 Aug 2021 09:59

Repository Staff Only: item control page