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Simulation study of single event burnout hardening technique on power UMOSFET using P-Island layer

Krishnamurthy, S. and Kannan, R. and Azmadi Hussin, F. (2020) Simulation study of single event burnout hardening technique on power UMOSFET using P-Island layer. [["eprint_typename_conference\_item" not defined]]

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Official URL: https://www.scopus.com/inward/record.uri?eid=2-s2....


Item Type:["eprint_typename_conference\_item" not defined]
Impact Factor:cited By 0
ID Code:24486
Deposited By: Ms Sharifah Fahimah Saiyed Yeop
Deposited On:27 Aug 2021 05:05
Last Modified:27 Aug 2021 05:05

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