A Karhunen Loeve Transform Approach for Recovering Evoked Potentials from Electroencephalograph

Yusoff, Mohd Zuki and Kamel , Nidal (2009) A Karhunen Loeve Transform Approach for Recovering Evoked Potentials from Electroencephalograph. In: the 7th International Conference on Robotics, Vision, Signal Processing and Power Applications (RoViSP 2009), December 19-20, 2009, Awana Porto Malai, Langkawi, Kedah, Malaysia.

Full text not available from this repository.
Official URL: http://www.rovisp.org/accepted-papers-cis.html

Abstract

A Karhunen Loeve Transform (KLT) approach for extracting evoked potentials (EPs) from the brain is proposed. The desired EP is heavily contaminated by colored electroencephalograph (EEG) noise which degrades the signal-to-noise ratio (SNR) to as low as -10 dB, making EP estimation highly challenging. The proposed time domain constrained KLT-based estimator explicitly applies pre-whitening on the noisy observation. The whitened data still enable the utilization of a symmetric basis matrix to be eigen-decomposed into its corresponding eigenvalue and eigenvector matrices. The diagonalization process actually decomposes the contaminated EP into decorrelated components; the components which are excessively dominated by EEG noise are discarded, and the ones which are less affected by the noise are preserved. Later, the preserved components are composed and correlated back to the original form to recover the desired EP. The performance of the filter in estimating the EP is then assessed using simulation and real patient data. The estimator produces reasonably low errors and high success rate in both experiments.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Departments / MOR / COE: Centre of Excellence > Center for Intelligent Signal and Imaging Research
Depositing User: Dr Mohd Zuki Yusoff
Date Deposited: 25 May 2010 04:21
Last Modified: 25 May 2010 04:21
URI: http://scholars.utp.edu.my/id/eprint/2274

Actions (login required)

View Item
View Item