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On Using IEEE 1500 Standard for Functional Testing

Ali, Ghazanfar and Hussin, Fawnizu Azmadi and Zain Ali, Noohul Basheer and Hamid, Nor Hisham (2013) On Using IEEE 1500 Standard for Functional Testing. In: 5th Asia Symposium on Quality Electronic Design (ASQED 2013), August 26 - 28, 2013, Penang, Malaysia.

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Abstract

In core based design (i.e. System on Chip) testing, IEEE 1500 standard has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in the functional mode. In this paper, a proposed method to enhance the IEEE 1500 standard for functional testing in order to increase observability during functional test is discussed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on SAYEH processor in order to test it using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the modification to the IEEE 1500 standard enables it to be used for functional testing, with increased observability.

Item Type:Conference or Workshop Item (Paper)
Academic Subject One:Academic Department - Electrical And Electronics - Pervasisve Systems - Digital Electronics - Test and Reliablity
Departments / MOR / COE:Centre of Excellence > Center for Intelligent Signal and Imaging Research
ID Code:11979
Deposited By: Dr Fawnizu Azmadi Hussin
Deposited On:07 Oct 2016 01:42
Last Modified:19 Jan 2017 08:21

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