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Enhancement in IEEE 1500 Standard for at-speed Test and Debug

Ali, Ghazanfar and Hussin, Fawnizu Azmadi and Zain Ali, Noohul Basheer and Hamid, Nor Hisham and Adnan, Raja Mahmud (2014) Enhancement in IEEE 1500 Standard for at-speed Test and Debug. In: 10th IEEE Dallas Circuits and Systems Conference (DCAS 2014), 12-13 October 2014, Dallas, USA.

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Abstract

IEEE 1500 standard provides the facility to test and debug embedded cores with the use of an on-board or off-board tester. So far all the developments in IEEE 1500 standard are for testing application in the test mode. No development in IEEE 1500 standard is proposed where IEEE 1500-compliant cores can be tested in functional mode of operation. In this paper, an enhancement of the IEEE 1500 standard for functional test and debug is proposed. As a case study, the proposed enhanced IEEE 1500 standard is implemented and validated on a SAYEH processor using embedded Software Based Self-Testing (SBST) technique. The case study demonstrated that the enhancement in IEEE 1500 standard enables it to be used for at-speed test and debug with increased observability.

Item Type:Conference or Workshop Item (Paper)
Academic Subject One:Academic Department - Electrical And Electronics - Pervasisve Systems - Digital Electronics - Test and Reliablity
Departments / MOR / COE:Centre of Excellence > Center for Intelligent Signal and Imaging Research
ID Code:11970
Deposited By: Dr Fawnizu Azmadi Hussin
Deposited On:07 Oct 2016 01:42
Last Modified:19 Jan 2017 08:21

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