Enhancement in IEEE 1500 Standard for At-Speed Functional Testing

Ali, Ghazanfar and Hussin, Fawnizu Azmadi and Zain Ali, Noohul Basheer and Hamid, Nor Hisham (2014) Enhancement in IEEE 1500 Standard for At-Speed Functional Testing. In: 5th International Conference on Intelligent and Advanced Systems, ICIAS 2014, 3-5 June 2014, Kuala Lumpur Malaysia.

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System on chip (SOC) makes it possible to design a complex system in a short period of time by using intellectual property (IP) blocks. The complexity of the design makes testing of the SOC a very difficult task. To alleviate this test access issue, IEEE 1500 has been introduced. It has become a widely used option because of its completeness and easy to use approach, but this standard is only supported in the test mode as it stays transparent in normal functional mode. In this paper, an enhancement of the existing IEEE 1500 standard for functional testing, during functional mode of operation, is proposed.

Item Type:Conference or Workshop Item (Paper)
Academic Subject One:Academic Department - Electrical And Electronics - Pervasisve Systems - Digital Electronics - Test and Reliablity
Departments / MOR / COE:Centre of Excellence > Center for Intelligent Signal and Imaging Research
ID Code:11966
Deposited By: Dr Fawnizu Azmadi Hussin
Deposited On:07 Oct 2016 01:42
Last Modified:19 Jan 2017 08:21

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